THE THERMAL FIELD MIGRATION AND ELECTRODIFFUSION OF CHARGED POINT DEFECTS IN POLYCRYSTALLINE FILMS OF CADMIUM CHALCOGENIDE
Polvonov Baxtiyor Zaylobidinovich1, Tulakova Saidaxon Rivojidinovna2, Xudoyberdieva Muxayoxon Zoirjon qizi3, Zaylobiddinov Bexzod Baxtiyorjon o‘g‘li4, Isaqjonov Lazizbek Saidahmad o‘g‘li5
Keywords:
Тонкая поликристаллическая пленка, теллурид кадмия, примеси, легирование, термическая обработка, аномальные фотовольтаические свойства, спектр фотолюминесценции, потенциальные барьеры, границы зеренAbstract
Correlation between spectrum of the low temperature photoluminescence and anomalous photovoltages properties of slanting evaporating polikryistallin thin films is discovered. In spectrum undoped sample on a number double-acting by band dominated the band to own luminescence, conditioned presence potential barrier on border of grains. Alloyage an impurity brings about stewing double-acting bands, but the most further thermal processing - to cutting the activations of the own band, full width on half maximum which is bound by maximum value photo generated voltage .
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Copyright (c) 2023 Бахтиёр Полвонов, Саидахон Тулакова, Мухаёхон Худойбердиева , Бехзод Зайлобиддинов , Лазизбек Исақжонов
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